%0 Conference Paper %1 conf/itc/AsakaYBD97 %A Asaka, Toshiharu %A Yoshida, Masaaki %A Bhattacharya, Subhrajit %A Dey, Sujit %B ITC %D 1997 %I IEEE Computer Society %K dblp %P 265-274 %T H-SCAN+: A Practical Low-Overhead RTL Design-for-Testability Technique for Industrial Designs. %U http://dblp.uni-trier.de/db/conf/itc/itc1997.html#AsakaYBD97 %@ 0-7803-4209-7

@inproceedings{conf/itc/AsakaYBD97, added-at = {2023-03-23T00:00:00.000+0100}, author = {Asaka, Toshiharu and Yoshida, Masaaki and Bhattacharya, Subhrajit and Dey, Sujit}, biburl = {https://www.bibsonomy.org/bibtex/22a025fae65ccdf147f3cef9300885541/dblp}, booktitle = {ITC}, crossref = {conf/itc/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1997.639622}, interhash = {08454179b7192f2798c193b199073645}, intrahash = {2a025fae65ccdf147f3cef9300885541}, isbn = {0-7803-4209-7}, keywords = {dblp}, pages = {265-274}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:11.000+0200}, title = {H-SCAN+: A Practical Low-Overhead RTL Design-for-Testability Technique for Industrial Designs.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1997.html#AsakaYBD97}, year = 1997 }