%0 Journal Article %1 journals/mr/LambertJBOMDTFBM10 %A Lambert, Benoit %A Jonsson, G. %A Bataille, J. %A Ollivier, C. %A Mezenge, P. %A Derewonko, H. %A Thomas, H. %A Floriot, D. %A Blanck, Hervé %A Moreau, C. %D 2010 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1543-1547 %T Reliability of high voltage/high power L/S-band Hbt technology. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#LambertJBOMDTFBM10 %V 50

@article{journals/mr/LambertJBOMDTFBM10, added-at = {2020-02-22T00:00:00.000+0100}, author = {Lambert, Benoit and Jonsson, G. and Bataille, J. and Ollivier, C. and Mezenge, P. and Derewonko, H. and Thomas, H. and Floriot, D. and Blanck, Hervé and Moreau, C.}, biburl = {https://www.bibsonomy.org/bibtex/22bded638ce2c7ca884f53e60c7105369/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.07.105}, interhash = {09c87004ed7e9b965e8d505936a2dfcf}, intrahash = {2bded638ce2c7ca884f53e60c7105369}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1543-1547}, timestamp = {2020-02-25T13:22:55.000+0100}, title = {Reliability of high voltage/high power L/S-band Hbt technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#LambertJBOMDTFBM10}, volume = 50, year = 2010 }