%0 Conference Paper %1 conf/iolts/NovakN01 %A Novák, Ondrej %A Nosek, Jiri %B IOLTW %D 2001 %I IEEE Computer Society %K dblp %P 90- %T Test-per-Clock Testing of the Circuits with Scan. %U http://dblp.uni-trier.de/db/conf/iolts/ioltw2001.html#NovakN01 %@ 0-7695-1290-9

@inproceedings{conf/iolts/NovakN01, added-at = {2023-03-23T00:00:00.000+0100}, author = {Novák, Ondrej and Nosek, Jiri}, biburl = {https://www.bibsonomy.org/bibtex/241ce4f28725535674950f45e918ab240/dblp}, booktitle = {IOLTW}, crossref = {conf/iolts/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/OLT.2001.937825}, interhash = {0db9ac83313ca5682849d9f97c35ecd6}, intrahash = {41ce4f28725535674950f45e918ab240}, isbn = {0-7695-1290-9}, keywords = {dblp}, pages = {90-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T10:51:14.000+0200}, title = {Test-per-Clock Testing of the Circuits with Scan.}, url = {http://dblp.uni-trier.de/db/conf/iolts/ioltw2001.html#NovakN01}, year = 2001 }