%0 Conference Paper %1 conf/ats/IwataMMT12 %A Iwata, Hiroyuki %A Maeda, Yoichi %A Matsushima, Jun %A Takakura, Masahiro %B Asian Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 1 %T An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms. %U http://dblp.uni-trier.de/db/conf/ats/ats2012.html#IwataMMT12 %@ 978-1-4673-4555-2

@inproceedings{conf/ats/IwataMMT12, added-at = {2023-03-24T00:00:00.000+0100}, author = {Iwata, Hiroyuki and Maeda, Yoichi and Matsushima, Jun and Takakura, Masahiro}, biburl = {https://www.bibsonomy.org/bibtex/249eaf1c776e8edf6f88835623bdaac56/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2012.39}, interhash = {0f1e9c93e345b7b2e0eb457973ec9939}, intrahash = {49eaf1c776e8edf6f88835623bdaac56}, isbn = {978-1-4673-4555-2}, keywords = {dblp}, pages = 1, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:33.000+0200}, title = {An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2012.html#IwataMMT12}, year = 2012 }