%0 Conference Paper %1 conf/ats/GianiSHA00 %A Giani, Ashish %A Sheng, Shuo %A Hsiao, Michael S. %A Agrawal, Vishwani D. %B Asian Test Symposium %D 2000 %I IEEE Computer Society %K dblp %P 159-164 %T Compaction-based test generation using state and fault information. %U http://dblp.uni-trier.de/db/conf/ats/ats2000.html#GianiSHA00 %@ 0-7695-0887-1

@inproceedings{conf/ats/GianiSHA00, added-at = {2023-03-24T00:00:00.000+0100}, author = {Giani, Ashish and Sheng, Shuo and Hsiao, Michael S. and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/2b4b80843501cb1c2384ef458624205c1/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2000.893619}, interhash = {1171818efbc2c96f79943cf6eacb5aa0}, intrahash = {b4b80843501cb1c2384ef458624205c1}, isbn = {0-7695-0887-1}, keywords = {dblp}, pages = {159-164}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:42.000+0200}, title = {Compaction-based test generation using state and fault information.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2000.html#GianiSHA00}, year = 2000 }