%0 Journal Article %1 journals/mr/SharmaTWRREPCG15 %A Sharma, Prateek %A Tyaginov, Stanislav %A Wimmer, Yannick %A Rudolf, Florian %A Rupp, Karl %A Enichlmair, Hubert %A Park, J. H. %A Ceric, Hajdin %A Grasser, Tibor %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1427-1432 %T Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#SharmaTWRREPCG15 %V 55

@article{journals/mr/SharmaTWRREPCG15, added-at = {2021-10-14T00:00:00.000+0200}, author = {Sharma, Prateek and Tyaginov, Stanislav and Wimmer, Yannick and Rudolf, Florian and Rupp, Karl and Enichlmair, Hubert and Park, J. H. and Ceric, Hajdin and Grasser, Tibor}, biburl = {https://www.bibsonomy.org/bibtex/20c3fbaeb095f5be61328593ff32a81af/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.021}, interhash = {133fd1930fe367c5873467b83cd329dd}, intrahash = {0c3fbaeb095f5be61328593ff32a81af}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1427-1432}, timestamp = {2024-04-09T02:50:51.000+0200}, title = {Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#SharmaTWRREPCG15}, volume = 55, year = 2015 }