%0 Conference Paper %1 conf/ats/ZeidlerWKVK11 %A Zeidler, Steffen %A Wolf, Christoph %A Krstic, Milos %A Vater, Frank %A Kraemer, Rolf %B Asian Test Symposium %D 2011 %I IEEE Computer Society %K %P 244-250 %T Design of a Test Processor for Asynchronous Chip Test. %U http://dblp.uni-trier.de/db/conf/ats/ats2011.html#ZeidlerWKVK11 %@ 978-1-4577-1984-4

@inproceedings{conf/ats/ZeidlerWKVK11, added-at = {2023-12-12T18:48:25.000+0100}, author = {Zeidler, Steffen and Wolf, Christoph and Krstic, Milos and Vater, Frank and Kraemer, Rolf}, biburl = {https://www.bibsonomy.org/bibtex/27d0db9289b06219fa277eebbdbe6547b/admin}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2011}, ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.17}, interhash = {1787203c7edfe320158fc21b14854ca1}, intrahash = {7d0db9289b06219fa277eebbdbe6547b}, isbn = {978-1-4577-1984-4}, keywords = {}, pages = {244-250}, publisher = {IEEE Computer Society}, timestamp = {2023-12-12T18:48:25.000+0100}, title = {Design of a Test Processor for Asynchronous Chip Test.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2011.html#ZeidlerWKVK11}, year = 2011 }