Inproceedings,
Low overhead test point insertion for scan-based BIST.
M. Nakao, S. Kobayashi, K. Hatayama, K. Iijima, and S. Terada.ITC, page 348-357. IEEE Computer Society, (1999)
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- BibTeX key
- conf/itc/NakaoKHIT99
- entry type
- inproceedings
- booktitle
- ITC
- year
- 1999
- pages
- 348-357
- publisher
- IEEE Computer Society
- crossref
- conf/itc/1999
- ee
- https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805649
- isbn
- 0-7803-5753-1
- url
- http://dblp.uni-trier.de/db/conf/itc/itc1999.html#NakaoKHIT99
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%1 conf/itc/NakaoKHIT99
%A Nakao, Michinobu
%A Kobayashi, Seiji
%A Hatayama, Kazumi
%A Iijima, Kazuhiko
%A Terada, Seiji
%B ITC
%D 1999
%I IEEE Computer Society
%K dblp
%P 348-357
%T Low overhead test point insertion for scan-based BIST.
%U http://dblp.uni-trier.de/db/conf/itc/itc1999.html#NakaoKHIT99
%@ 0-7803-5753-1
@inproceedings{conf/itc/NakaoKHIT99,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Nakao, Michinobu and Kobayashi, Seiji and Hatayama, Kazumi and Iijima, Kazuhiko and Terada, Seiji},
biburl = {https://www.bibsonomy.org/bibtex/27737d063b5be405c184e5e714e78a602/dblp},
booktitle = {ITC},
crossref = {conf/itc/1999},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805649},
interhash = {196848aaad7c3d80e1eadee971888955},
intrahash = {7737d063b5be405c184e5e714e78a602},
isbn = {0-7803-5753-1},
keywords = {dblp},
pages = {348-357},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T19:53:23.000+0200},
title = {Low overhead test point insertion for scan-based BIST.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc1999.html#NakaoKHIT99},
year = 1999
}