%0 Journal Article %1 journals/mr/RodriguezAGHGP06 %A Rodriguez, Nicolas %A Adrian, Jérôme %A Grosjean, Catherine %A Haller, Gérald %A Girardeaux, Christophe %A Portavoce, Alain %D 2006 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1554-1557 %T Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#RodriguezAGHGP06 %V 46

@article{journals/mr/RodriguezAGHGP06, added-at = {2023-08-03T00:00:00.000+0200}, author = {Rodriguez, Nicolas and Adrian, Jérôme and Grosjean, Catherine and Haller, Gérald and Girardeaux, Christophe and Portavoce, Alain}, biburl = {https://www.bibsonomy.org/bibtex/26361c8d3a77a6a8e7bd1082b4eaa6a7b/dblp}, ee = {https://doi.org/10.1016/j.microrel.2006.07.019}, interhash = {1b253bcc67371d259e8051f890f6bbc8}, intrahash = {6361c8d3a77a6a8e7bd1082b4eaa6a7b}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1554-1557}, timestamp = {2024-04-09T02:49:37.000+0200}, title = {Evaluation of scanning capacitance microscopy sample preparation by focused ion beam.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#RodriguezAGHGP06}, volume = 46, year = 2006 }