%0 Journal Article %1 journals/mr/LimCGD13 %A Lim, M. K. %A Chouliaras, Vassilios A. %A Gan, Chee Lip %A Dwyer, Vincent M. %D 2013 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1261-1265 %T Bidirectional electromigration failure. %U http://dblp.uni-trier.de/db/journals/mr/mr53.html#LimCGD13 %V 53

@article{journals/mr/LimCGD13, added-at = {2020-02-22T00:00:00.000+0100}, author = {Lim, M. K. and Chouliaras, Vassilios A. and Gan, Chee Lip and Dwyer, Vincent M.}, biburl = {https://www.bibsonomy.org/bibtex/20ddac30d4df9be86b580773368cecaed/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.07.017}, interhash = {20ddd114e2f485a654a75b4a808d782b}, intrahash = {0ddac30d4df9be86b580773368cecaed}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1261-1265}, timestamp = {2020-02-25T13:30:08.000+0100}, title = {Bidirectional electromigration failure.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr53.html#LimCGD13}, volume = 53, year = 2013 }