%0 Journal Article %1 journals/tcas/StJohnF06 %A John, Ian St. %A Fox, Robert M. %D 2006 %J IEEE Trans. Circuits Syst. II Express Briefs %K dblp %N 7 %P 577-579 %T Leakage effects in metal-connected floating-gate circuits. %U http://dblp.uni-trier.de/db/journals/tcas/tcasII53.html#StJohnF06 %V 53-II

@article{journals/tcas/StJohnF06, added-at = {2020-05-27T00:00:00.000+0200}, author = {John, Ian St. and Fox, Robert M.}, biburl = {https://www.bibsonomy.org/bibtex/2ab9d216f40ed1cd037338e49c3f8a2f8/dblp}, ee = {https://doi.org/10.1109/TCSII.2006.875317}, interhash = {24abd5910e9aa8a8cdef811f133b36ce}, intrahash = {ab9d216f40ed1cd037338e49c3f8a2f8}, journal = {IEEE Trans. Circuits Syst. II Express Briefs}, keywords = {dblp}, number = 7, pages = {577-579}, timestamp = {2020-05-28T11:52:02.000+0200}, title = {Leakage effects in metal-connected floating-gate circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcas/tcasII53.html#StJohnF06}, volume = {53-II}, year = 2006 }