%0 Journal Article %1 journals/tie/ShengFW00 %A Sheng, Kuang %A Finney, Stephen J. %A Williams, Barry W. %D 2000 %J IEEE Trans. Ind. Electron. %K dblp %N 1 %P 9-16 %T Thermal stability of IGBT high-frequency operation. %U http://dblp.uni-trier.de/db/journals/tie/tie47.html#ShengFW00 %V 47

@article{journals/tie/ShengFW00, added-at = {2020-05-22T00:00:00.000+0200}, author = {Sheng, Kuang and Finney, Stephen J. and Williams, Barry W.}, biburl = {https://www.bibsonomy.org/bibtex/2bf2d7cdca64111066aa21c568f8d101f/dblp}, ee = {https://doi.org/10.1109/41.824018}, interhash = {1295d7477e41fa6ff5611810027af54c}, intrahash = {bf2d7cdca64111066aa21c568f8d101f}, journal = {IEEE Trans. Ind. Electron.}, keywords = {dblp}, number = 1, pages = {9-16}, timestamp = {2020-05-23T11:46:53.000+0200}, title = {Thermal stability of IGBT high-frequency operation.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie47.html#ShengFW00}, volume = 47, year = 2000 }