%0 Conference Paper %1 conf/iolts/RibasSRI11 %A Ribas, Renato P. %A Sun, Yuyang %A Reis, André Inácio %A Ivanov, André %B IOLTS %D 2011 %I IEEE Computer Society %K dblp %P 210-213 %T Self-checking test circuits for latches and flip-flops. %U http://dblp.uni-trier.de/db/conf/iolts/iolts2011.html#RibasSRI11 %@ 978-1-4577-1053-7

@inproceedings{conf/iolts/RibasSRI11, added-at = {2023-03-23T00:00:00.000+0100}, author = {Ribas, Renato P. and Sun, Yuyang and Reis, André Inácio and Ivanov, André}, biburl = {https://www.bibsonomy.org/bibtex/2cac4baef20f827b7f6dd9c04c7133529/dblp}, booktitle = {IOLTS}, crossref = {conf/iolts/2011}, ee = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2011.5993846}, interhash = {29a74acdf63ad557862a01cc10019bdf}, intrahash = {cac4baef20f827b7f6dd9c04c7133529}, isbn = {978-1-4577-1053-7}, keywords = {dblp}, pages = {210-213}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T10:52:08.000+0200}, title = {Self-checking test circuits for latches and flip-flops.}, url = {http://dblp.uni-trier.de/db/conf/iolts/iolts2011.html#RibasSRI11}, year = 2011 }