%0 Journal Article %1 journals/mr/NgTLEATP14 %A Ng, Wee Loon %A Tee, Kheng Chok %A Liu, Junfeng %A Ee, Yong Chiang %A Aubel, Oliver %A Tan, Chuan Seng %A Pey, Kin Leong %D 2014 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1666-1670 %T Robust Electromigration reliability through engineering optimization. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#NgTLEATP14 %V 54

@article{journals/mr/NgTLEATP14, added-at = {2022-10-02T00:00:00.000+0200}, author = {Ng, Wee Loon and Tee, Kheng Chok and Liu, Junfeng and Ee, Yong Chiang and Aubel, Oliver and Tan, Chuan Seng and Pey, Kin Leong}, biburl = {https://www.bibsonomy.org/bibtex/21f90c7bc6574078170fc97bd2a2b7301/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.07.096}, interhash = {2e0daf992c50af43db821d2d95c94a76}, intrahash = {1f90c7bc6574078170fc97bd2a2b7301}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1666-1670}, timestamp = {2024-04-09T02:49:20.000+0200}, title = {Robust Electromigration reliability through engineering optimization.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#NgTLEATP14}, volume = 54, year = 2014 }