%0 Conference Paper %1 conf/icst/KobashiYWFYOK15 %A Kobashi, Takanori %A Yoshizawa, Masatoshi %A Washizaki, Hironori %A Fukazawa, Yoshiaki %A Yoshioka, Nobukazu %A Okubo, Takao %A Kaiya, Haruhiko %B ICST %D 2015 %I IEEE Computer Society %K dblp %P 1-8 %T TESEM: A Tool for Verifying Security Design Pattern Applications by Model Testing. %U http://dblp.uni-trier.de/db/conf/icst/icst2015.html#KobashiYWFYOK15 %@ 978-1-4799-7125-1

@inproceedings{conf/icst/KobashiYWFYOK15, added-at = {2023-03-23T00:00:00.000+0100}, author = {Kobashi, Takanori and Yoshizawa, Masatoshi and Washizaki, Hironori and Fukazawa, Yoshiaki and Yoshioka, Nobukazu and Okubo, Takao and Kaiya, Haruhiko}, biburl = {https://www.bibsonomy.org/bibtex/2d7d5c6d57dc71aa52b4eb7856b261917/dblp}, booktitle = {ICST}, crossref = {conf/icst/2015}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICST.2015.7102633}, interhash = {2f25e18aa7b13022bfe0ca86a5b9cde6}, intrahash = {d7d5c6d57dc71aa52b4eb7856b261917}, isbn = {978-1-4799-7125-1}, keywords = {dblp}, pages = {1-8}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T18:22:42.000+0200}, title = {TESEM: A Tool for Verifying Security Design Pattern Applications by Model Testing.}, url = {http://dblp.uni-trier.de/db/conf/icst/icst2015.html#KobashiYWFYOK15}, year = 2015 }