%0 Journal Article %1 journals/ieiceee/HayashiNKK15 %A Hayashi, Daisuke %A Nakao, Kazuya %A Katayama, Takeo %A Kawaguchi, Hitoshi %D 2015 %J IEICE Electron. Express %K dblp %N 13 %P 20150479 %T Bit error rates of flip-flop operations with AND gate functionality using a 1.55-µm polarization bistable VCSEL. %U http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee12.html#HayashiNKK15 %V 12

@article{journals/ieiceee/HayashiNKK15, added-at = {2021-02-12T00:00:00.000+0100}, author = {Hayashi, Daisuke and Nakao, Kazuya and Katayama, Takeo and Kawaguchi, Hitoshi}, biburl = {https://www.bibsonomy.org/bibtex/2462ff5617c74a932dbc3f890528850e8/dblp}, ee = {https://doi.org/10.1587/elex.12.20150479}, interhash = {345cb52509c44e8e5d90f7149827c2da}, intrahash = {462ff5617c74a932dbc3f890528850e8}, journal = {IEICE Electron. Express}, keywords = {dblp}, number = 13, pages = 20150479, timestamp = {2024-04-09T06:48:50.000+0200}, title = {Bit error rates of flip-flop operations with AND gate functionality using a 1.55-µm polarization bistable VCSEL.}, url = {http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee12.html#HayashiNKK15}, volume = 12, year = 2015 }