%0 Conference Paper %1 conf/itc/MingJYWM15 %A Ming, Xue %A Johann, Koelz %A York, Lee Chow %A Wee, Lee Kwan %A Min, Shi Zhi %B ITC %D 2015 %I IEEE %K dblp %P 1-9 %T Electrical package defect testing for volume production. %U http://dblp.uni-trier.de/db/conf/itc/itc2015.html#MingJYWM15 %@ 978-1-4673-6578-9

@inproceedings{conf/itc/MingJYWM15, added-at = {2015-12-08T00:00:00.000+0100}, author = {Ming, Xue and Johann, Koelz and York, Lee Chow and Wee, Lee Kwan and Min, Shi Zhi}, biburl = {https://www.bibsonomy.org/bibtex/294b482bb073f40d52e7eff83c8152e90/dblp}, booktitle = {ITC}, crossref = {conf/itc/2015}, ee = {http://dx.doi.org/10.1109/TEST.2015.7342400}, interhash = {3963e4212f2f0965cd7019ce0ec919e6}, intrahash = {94b482bb073f40d52e7eff83c8152e90}, isbn = {978-1-4673-6578-9}, keywords = {dblp}, pages = {1-9}, publisher = {IEEE}, timestamp = {2015-12-10T11:59:50.000+0100}, title = {Electrical package defect testing for volume production.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2015.html#MingJYWM15}, year = 2015 }