%0 Journal Article %1 journals/mr/RosaBWKOR15 %A Rosa, Felipe %A Brum, Raphael Martins %A Wirth, Gilson I. %A de Lima Kastensmidt, Fernanda Gusmão %A Ost, Luciano %A Reis, Ricardo %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1486-1490 %T Impact of dynamic voltage scaling and thermal factors on SRAM reliability. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#RosaBWKOR15 %V 55

@article{journals/mr/RosaBWKOR15, added-at = {2022-10-13T00:00:00.000+0200}, author = {Rosa, Felipe and Brum, Raphael Martins and Wirth, Gilson I. and de Lima Kastensmidt, Fernanda Gusmão and Ost, Luciano and Reis, Ricardo}, biburl = {https://www.bibsonomy.org/bibtex/2afe2fb218fbd8d13f76f867478b55540/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.07.013}, interhash = {396d9c85c5a38fdbbd4381fb30136bac}, intrahash = {afe2fb218fbd8d13f76f867478b55540}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1486-1490}, timestamp = {2024-04-09T02:48:51.000+0200}, title = {Impact of dynamic voltage scaling and thermal factors on SRAM reliability.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#RosaBWKOR15}, volume = 55, year = 2015 }