%0 Conference Paper %1 conf/dac/ChengTDRK96 %A Cheng, Yi-Kan %A Teng, Chin-Chi %A Dharchoudhury, Abhijit %A Rosenbaum, Elyse %A Kang, Sung-Mo %B DAC %D 1996 %E Pennino, Thomas %E Yoffa, Ellen J. %I ACM Press %K dblp %P 548-551 %T iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. %U http://dblp.uni-trier.de/db/conf/dac/dac96.html#ChengTDRK96 %@ 0-89791-779-0

@inproceedings{conf/dac/ChengTDRK96, added-at = {2017-03-16T00:00:00.000+0100}, author = {Cheng, Yi-Kan and Teng, Chin-Chi and Dharchoudhury, Abhijit and Rosenbaum, Elyse and Kang, Sung-Mo}, biburl = {https://www.bibsonomy.org/bibtex/25143c4ddd6d5267cd39964c429959850/dblp}, booktitle = {DAC}, crossref = {conf/dac/1996}, editor = {Pennino, Thomas and Yoffa, Ellen J.}, ee = {http://doi.acm.org/10.1145/240518.240622}, interhash = {13bf6f224312cb5c867ccc6876417c92}, intrahash = {5143c4ddd6d5267cd39964c429959850}, isbn = {0-89791-779-0}, keywords = {dblp}, pages = {548-551}, publisher = {ACM Press}, timestamp = {2017-03-17T11:39:35.000+0100}, title = {iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac96.html#ChengTDRK96}, year = 1996 }