%0 Conference Paper %1 conf/cicc/WalshS06 %A Walsh, Joe %A Scott, G. %B CICC %D 2006 %I IEEE %K dblp %P 449-452 %T High-Temperature, High Reliability EEPROM Design For Automotive Applications. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2006.html#WalshS06 %@ 1-4244-0075-9

@inproceedings{conf/cicc/WalshS06, added-at = {2021-05-20T00:00:00.000+0200}, author = {Walsh, Joe and Scott, G.}, biburl = {https://www.bibsonomy.org/bibtex/2789dfd33421a476704650da646dd5e61/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2006}, ee = {https://doi.org/10.1109/CICC.2006.320818}, interhash = {40fecd8df0b5d8c5505706f9ebe9b672}, intrahash = {789dfd33421a476704650da646dd5e61}, isbn = {1-4244-0075-9}, keywords = {dblp}, pages = {449-452}, publisher = {IEEE}, timestamp = {2024-04-10T22:11:27.000+0200}, title = {High-Temperature, High Reliability EEPROM Design For Automotive Applications.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2006.html#WalshS06}, year = 2006 }