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%0 Journal Article
%1 journals/mr/BersukerSYCZBLM04
%A Bersuker, Gennadi
%A Sim, Jang H.
%A Young, Chadwin D.
%A Choi, Rino
%A Zeitzoff, Peter
%A Brown, George A.
%A Lee, Byoung Hun
%A Murto, Robert W.
%D 2004
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 1509-1512
%T Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics.
%U http://dblp.uni-trier.de/db/journals/mr/mr44.html#BersukerSYCZBLM04
%V 44
@article{journals/mr/BersukerSYCZBLM04,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Bersuker, Gennadi and Sim, Jang H. and Young, Chadwin D. and Choi, Rino and Zeitzoff, Peter and Brown, George A. and Lee, Byoung Hun and Murto, Robert W.},
biburl = {https://www.bibsonomy.org/bibtex/219c91c8c4d93ebee40da80deaa76971a/dblp},
ee = {https://doi.org/10.1016/j.microrel.2004.07.048},
interhash = {47c43b15cff871e5a075298d1f012d44},
intrahash = {19c91c8c4d93ebee40da80deaa76971a},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {1509-1512},
timestamp = {2020-02-25T13:29:31.000+0100},
title = {Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#BersukerSYCZBLM04},
volume = 44,
year = 2004
}