%0 Conference Paper %1 conf/ats/VatajeluDBGTVB13 %A Vatajelu, Elena I. %A Dilillo, Luigi %A Bosio, Alberto %A Girard, Patrick %A Todri, Aida %A Virazel, Arnaud %A Badereddine, Nabil %B Asian Test Symposium %D 2013 %I IEEE Computer Society %K dblp %P 109-114 %T Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing. %U http://dblp.uni-trier.de/db/conf/ats/ats2013.html#VatajeluDBGTVB13 %@ 978-0-7695-5080-0

@inproceedings{conf/ats/VatajeluDBGTVB13, added-at = {2023-09-30T00:00:00.000+0200}, author = {Vatajelu, Elena I. and Dilillo, Luigi and Bosio, Alberto and Girard, Patrick and Todri, Aida and Virazel, Arnaud and Badereddine, Nabil}, biburl = {https://www.bibsonomy.org/bibtex/29ca2de26e0859270a74e8ea15effb9a6/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2013}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2013.30}, interhash = {4919bbd872170f3c04cb5ba2743c4465}, intrahash = {9ca2de26e0859270a74e8ea15effb9a6}, isbn = {978-0-7695-5080-0}, keywords = {dblp}, pages = {109-114}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:09.000+0200}, title = {Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2013.html#VatajeluDBGTVB13}, year = 2013 }