%0 Conference Paper %1 conf/ats/HashizumeTYTMK03 %A Hashizume, Masaki %A Takeda, Teppei %A Yotsuyanagi, Hiroyuki %A Tamesada, Takeomi %A Miura, Yukiya %A Kinoshita, Kozo %B Asian Test Symposium %D 2003 %I IEEE Computer Society %K dblp %P 390-395 %T A BIST Circuit for IDDQ Tests. %U http://dblp.uni-trier.de/db/conf/ats/ats2003.html#HashizumeTYTMK03 %@ 0-7695-1951-2

@inproceedings{conf/ats/HashizumeTYTMK03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Hashizume, Masaki and Takeda, Teppei and Yotsuyanagi, Hiroyuki and Tamesada, Takeomi and Miura, Yukiya and Kinoshita, Kozo}, biburl = {https://www.bibsonomy.org/bibtex/2c13dae1898dfc88cf46ec4909adae99a/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250843}, interhash = {4e8fd49cd2f3bb77dee6d5f5c18143fb}, intrahash = {c13dae1898dfc88cf46ec4909adae99a}, isbn = {0-7695-1951-2}, keywords = {dblp}, pages = {390-395}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:36.000+0200}, title = {A BIST Circuit for IDDQ Tests.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2003.html#HashizumeTYTMK03}, year = 2003 }