%0 Journal Article %1 journals/mr/ZisserCWS14 %A Zisser, Wolfhard H. %A Ceric, Hajdin %A Weinbub, Josef %A Selberherr, Siegfried %D 2014 %J Microelectron. Reliab. %K dblp %N 9-10 %P 2133-2137 %T Electromigration reliability of open TSV structures. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#ZisserCWS14 %V 54

@article{journals/mr/ZisserCWS14, added-at = {2021-10-14T00:00:00.000+0200}, author = {Zisser, Wolfhard H. and Ceric, Hajdin and Weinbub, Josef and Selberherr, Siegfried}, biburl = {https://www.bibsonomy.org/bibtex/2dba0228a8b8db99470bcefd30f4c9c05/dblp}, ee = {https://www.wikidata.org/entity/Q62599876}, interhash = {5751f550d50c4d7aec756e580d8b4cb0}, intrahash = {dba0228a8b8db99470bcefd30f4c9c05}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {2133-2137}, timestamp = {2024-04-09T02:49:20.000+0200}, title = {Electromigration reliability of open TSV structures.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#ZisserCWS14}, volume = 54, year = 2014 }