%0 Journal Article %1 journals/tcad/HuangKTS16 %A Huang, Xin %A Kteyan, Armen %A Tan, Sheldon X.-D. %A Sukharev, Valeriy %D 2016 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 11 %P 1848-1861 %T Physics-Based Electromigration Models and Full-Chip Assessment for Power Grid Networks. %U http://dblp.uni-trier.de/db/journals/tcad/tcad35.html#HuangKTS16 %V 35

@article{journals/tcad/HuangKTS16, added-at = {2020-09-24T00:00:00.000+0200}, author = {Huang, Xin and Kteyan, Armen and Tan, Sheldon X.-D. and Sukharev, Valeriy}, biburl = {https://www.bibsonomy.org/bibtex/2cdbe3761346e26362cb14c615411a70b/dblp}, ee = {https://www.wikidata.org/entity/Q60154749}, interhash = {5ea9edff57164f4d7d49a62783a6bb62}, intrahash = {cdbe3761346e26362cb14c615411a70b}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 11, pages = {1848-1861}, timestamp = {2020-09-25T11:50:19.000+0200}, title = {Physics-Based Electromigration Models and Full-Chip Assessment for Power Grid Networks.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad35.html#HuangKTS16}, volume = 35, year = 2016 }