%0 Conference Paper %1 conf/vlsid/ChakrabortyA95 %A Chakraborty, Tapan J. %A Agrawal, Vishwani D. %B VLSI Design %D 1995 %I IEEE Computer Society %K dblp %P 42-46 %T Robust testing for stuck-at faults. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#ChakrabortyA95 %@ 0-8186-6905-5

@inproceedings{conf/vlsid/ChakrabortyA95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Chakraborty, Tapan J. and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/24e775e30b46e36bef7bccd8f297c49b2/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512075}, interhash = {61c7ea8ddc088f15cdaa78ed76ce7600}, intrahash = {4e775e30b46e36bef7bccd8f297c49b2}, isbn = {0-8186-6905-5}, keywords = {dblp}, pages = {42-46}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T05:46:44.000+0200}, title = {Robust testing for stuck-at faults.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#ChakrabortyA95}, year = 1995 }