%0 Journal Article %1 journals/dt/SabadeW05 %A Sabade, Sagar S. %A Walker, Duncan M. Hank %D 2005 %J IEEE Des. Test Comput. %K dblp %N 6 %P 586-595 %T IC Outlier Identification Using Multiple Test Metrics. %U http://dblp.uni-trier.de/db/journals/dt/dt22.html#SabadeW05 %V 22

@article{journals/dt/SabadeW05, added-at = {2020-05-17T00:00:00.000+0200}, author = {Sabade, Sagar S. and Walker, Duncan M. Hank}, biburl = {https://www.bibsonomy.org/bibtex/2e3d274511f898984ff2090b429dd8024/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.143}, interhash = {6d6a8509b4b7ef646832beba0aad26da}, intrahash = {e3d274511f898984ff2090b429dd8024}, journal = {IEEE Des. Test Comput.}, keywords = {dblp}, number = 6, pages = {586-595}, timestamp = {2020-05-19T12:20:59.000+0200}, title = {IC Outlier Identification Using Multiple Test Metrics.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt22.html#SabadeW05}, volume = 22, year = 2005 }