%0 Journal Article %1 journals/tcad/HeraguAB95 %A Heragu, Keerthi %A Agrawal, Vishwani D. %A Bushnell, Michael L. %D 1995 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 5 %P 590-596 %T Fault coverage estimation by test vector sampling. %U http://dblp.uni-trier.de/db/journals/tcad/tcad14.html#HeraguAB95 %V 14

@article{journals/tcad/HeraguAB95, added-at = {2020-09-24T00:00:00.000+0200}, author = {Heragu, Keerthi and Agrawal, Vishwani D. and Bushnell, Michael L.}, biburl = {https://www.bibsonomy.org/bibtex/2dfc6021a4cc2f8157f87672c985ca1be/dblp}, ee = {https://doi.org/10.1109/43.384421}, interhash = {6e1b395f88fe56b7d74b41bfbebb8c1d}, intrahash = {dfc6021a4cc2f8157f87672c985ca1be}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 5, pages = {590-596}, timestamp = {2020-09-25T11:47:21.000+0200}, title = {Fault coverage estimation by test vector sampling.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad14.html#HeraguAB95}, volume = 14, year = 1995 }