%0 Journal Article %1 journals/mr/TakedaMTOEHK02 %A Takeda, Eiji %A Murakami, Eiichi %A Torii, Kazuyoshi %A Okuyama, Yutaka %A Ebe, Eishi %A Hinode, Kenji %A Kimura, Shin'ichiro %D 2002 %J Microelectron. Reliab. %K dblp %N 4-5 %P 493-506 %T Reliability issues of silicon LSIs facing 100-nm technology node. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#TakedaMTOEHK02 %V 42

@article{journals/mr/TakedaMTOEHK02, added-at = {2020-02-22T00:00:00.000+0100}, author = {Takeda, Eiji and Murakami, Eiichi and Torii, Kazuyoshi and Okuyama, Yutaka and Ebe, Eishi and Hinode, Kenji and Kimura, Shin'ichiro}, biburl = {https://www.bibsonomy.org/bibtex/24680eb34c0783f45f1a14f4a57511255/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00029-X}, interhash = {7c524f783b178ed35da92382c5caa9f8}, intrahash = {4680eb34c0783f45f1a14f4a57511255}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {4-5}, pages = {493-506}, timestamp = {2020-02-25T13:30:08.000+0100}, title = {Reliability issues of silicon LSIs facing 100-nm technology node.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#TakedaMTOEHK02}, volume = 42, year = 2002 }