%0 Journal Article %1 journals/mr/ChoiBJIWUM16 %A Choi, Ui-Min %A Blaabjerg, Frede %A Jørgensen, Søren %A Iannuzzo, Francesco %A Wang, Huai %A Uhrenfeldt, Christian %A Munk-Nielsen, Stig %D 2016 %J Microelectron. Reliab. %K dblp %P 403-408 %T Power cycling test and failure analysis of molded Intelligent Power IGBT Module under different temperature swing durations. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChoiBJIWUM16 %V 64

@article{journals/mr/ChoiBJIWUM16, added-at = {2023-09-26T00:00:00.000+0200}, author = {Choi, Ui-Min and Blaabjerg, Frede and Jørgensen, Søren and Iannuzzo, Francesco and Wang, Huai and Uhrenfeldt, Christian and Munk-Nielsen, Stig}, biburl = {https://www.bibsonomy.org/bibtex/216c0799a00038f3f8c862af7c55bc9ac/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.07.020}, interhash = {18270cd434d5e06208331eecf848d4be}, intrahash = {16c0799a00038f3f8c862af7c55bc9ac}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {403-408}, timestamp = {2024-04-09T02:48:51.000+0200}, title = {Power cycling test and failure analysis of molded Intelligent Power IGBT Module under different temperature swing durations.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChoiBJIWUM16}, volume = 64, year = 2016 }