%0 Journal Article %1 journals/mr/JacquetSCRAZdM15 %A Jacquet, Thomas %A Sasso, Grazia %A Chakravorty, Anjan %A Rinaldi, Niccolò %A Aufinger, Klaus %A Zimmer, Thomas %A d'Alessandro, Vincenzo %A Maneux, Cristell %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1433-1437 %T Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#JacquetSCRAZdM15 %V 55

@article{journals/mr/JacquetSCRAZdM15, added-at = {2020-02-22T00:00:00.000+0100}, author = {Jacquet, Thomas and Sasso, Grazia and Chakravorty, Anjan and Rinaldi, Niccolò and Aufinger, Klaus and Zimmer, Thomas and d'Alessandro, Vincenzo and Maneux, Cristell}, biburl = {https://www.bibsonomy.org/bibtex/23c7cad152fbf22fe4228d9b0ab0bf06c/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.092}, interhash = {843a1694722eef5bb790c78fc7e826de}, intrahash = {3c7cad152fbf22fe4228d9b0ab0bf06c}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1433-1437}, timestamp = {2020-02-25T13:27:17.000+0100}, title = {Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#JacquetSCRAZdM15}, volume = 55, year = 2015 }