%0 Journal Article %1 journals/mr/HeerDBPGFKS06 %A Heer, Michael %A Dubec, Viktor %A Bychikhin, Sergey %A Pogany, Dionyz %A Gornik, Erich %A Frank, M. %A Konrad, A. %A Schulz, J. %D 2006 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1591-1596 %T Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#HeerDBPGFKS06 %V 46

@article{journals/mr/HeerDBPGFKS06, added-at = {2022-03-16T00:00:00.000+0100}, author = {Heer, Michael and Dubec, Viktor and Bychikhin, Sergey and Pogany, Dionyz and Gornik, Erich and Frank, M. and Konrad, A. and Schulz, J.}, biburl = {https://www.bibsonomy.org/bibtex/269dfa2c67f64c9c2339491530df1991c/dblp}, ee = {https://www.wikidata.org/entity/Q110626916}, interhash = {88058a4163aba4d41d4e77303032ba81}, intrahash = {69dfa2c67f64c9c2339491530df1991c}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1591-1596}, timestamp = {2024-04-09T02:49:13.000+0200}, title = {Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#HeerDBPGFKS06}, volume = 46, year = 2006 }