%0 Conference Paper %1 conf/itc/NelsonDM01 %A Nelson, Eric A. %A Dreibelbis, Jeffrey H. %A McConnell, Roderick %B ITC %D 2001 %I IEEE Computer Society %K dblp %P 173-181 %T Test and repair of large embedded DRAMs. 2. %U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#NelsonDM01 %@ 0-7803-7169-0

@inproceedings{conf/itc/NelsonDM01, added-at = {2023-03-23T00:00:00.000+0100}, author = {Nelson, Eric A. and Dreibelbis, Jeffrey H. and McConnell, Roderick}, biburl = {https://www.bibsonomy.org/bibtex/231e4f59acb996c26cd7c4745f6ded3f2/dblp}, booktitle = {ITC}, crossref = {conf/itc/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2001.966631}, interhash = {8be726066e84fcba0564b1c5fc2e2dff}, intrahash = {31e4f59acb996c26cd7c4745f6ded3f2}, isbn = {0-7803-7169-0}, keywords = {dblp}, pages = {173-181}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:56.000+0200}, title = {Test and repair of large embedded DRAMs. 2.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#NelsonDM01}, year = 2001 }