Inproceedings,
Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs.
R. Kanj, R. Joshi, J. Sivagnaname, J. Kuang, D. Acharyya, T. Nguyen, C. McDowell, and S. Nassif.ISQED, page 33-40. IEEE Computer Society, (2007)
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- conf/isqed/KanjJSKANMN07
- entry type
- inproceedings
- booktitle
- ISQED
- year
- 2007
- pages
- 33-40
- publisher
- IEEE Computer Society
- crossref
- conf/isqed/2007
- ee
- https://doi.ieeecomputersociety.org/10.1109/ISQED.2007.83
- isbn
- 978-0-7695-2795-6
- url
- http://dblp.uni-trier.de/db/conf/isqed/isqed2007.html#KanjJSKANMN07
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%1 conf/isqed/KanjJSKANMN07
%A Kanj, Rouwaida
%A Joshi, Rajiv V.
%A Sivagnaname, Jayakumaran
%A Kuang, Jente B.
%A Acharyya, Dhruva
%A Nguyen, Tuyet
%A McDowell, Chandler
%A Nassif, Sani R.
%B ISQED
%D 2007
%I IEEE Computer Society
%K dblp
%P 33-40
%T Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs.
%U http://dblp.uni-trier.de/db/conf/isqed/isqed2007.html#KanjJSKANMN07
%@ 978-0-7695-2795-6
@inproceedings{conf/isqed/KanjJSKANMN07,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Kanj, Rouwaida and Joshi, Rajiv V. and Sivagnaname, Jayakumaran and Kuang, Jente B. and Acharyya, Dhruva and Nguyen, Tuyet and McDowell, Chandler and Nassif, Sani R.},
biburl = {https://www.bibsonomy.org/bibtex/27ef7ca76bd7ca8da55eb311fecdba039/dblp},
booktitle = {ISQED},
crossref = {conf/isqed/2007},
ee = {https://doi.ieeecomputersociety.org/10.1109/ISQED.2007.83},
interhash = {8f393bd95c792a160be0d5bb3971555c},
intrahash = {7ef7ca76bd7ca8da55eb311fecdba039},
isbn = {978-0-7695-2795-6},
keywords = {dblp},
pages = {33-40},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T14:09:55.000+0200},
title = {Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs.},
url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2007.html#KanjJSKANMN07},
year = 2007
}