%0 Journal Article %1 journals/tcad/Pomeranz04a %A Pomeranz, Irith %D 2004 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 10 %P 1465-1478 %T Reducing test-data volume using P-testable scan chains in circuits with multiple scan chains. %U http://dblp.uni-trier.de/db/journals/tcad/tcad23.html#Pomeranz04a %V 23

@article{journals/tcad/Pomeranz04a, added-at = {2020-09-24T00:00:00.000+0200}, author = {Pomeranz, Irith}, biburl = {https://www.bibsonomy.org/bibtex/236908d95bb83f30d3f95eceae30602ae/dblp}, ee = {https://doi.org/10.1109/TCAD.2004.835131}, interhash = {91a158be7e63145a35d25581784db759}, intrahash = {36908d95bb83f30d3f95eceae30602ae}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 10, pages = {1465-1478}, timestamp = {2020-09-25T11:49:54.000+0200}, title = {Reducing test-data volume using P-testable scan chains in circuits with multiple scan chains.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad23.html#Pomeranz04a}, volume = 23, year = 2004 }