%0 Journal Article %1 journals/et/MaurouxVBDGPGFV12 %A Mauroux, Pierre-Didier %A Virazel, Arnaud %A Bosio, Alberto %A Dilillo, Luigi %A Girard, Patrick %A Pravossoudovitch, Serge %A Godard, Benoît %A Festes, Gilles %A Vachez, Laurent %D 2012 %J J. Electron. Test. %K dblp %N 2 %P 215-228 %T Analysis and Fault Modeling of Actual Resistive Defects in ATMEL TSTACTM eFlash Memories. %U http://dblp.uni-trier.de/db/journals/et/et28.html#MaurouxVBDGPGFV12 %V 28

@article{journals/et/MaurouxVBDGPGFV12, added-at = {2020-09-11T00:00:00.000+0200}, author = {Mauroux, Pierre-Didier and Virazel, Arnaud and Bosio, Alberto and Dilillo, Luigi and Girard, Patrick and Pravossoudovitch, Serge and Godard, Benoît and Festes, Gilles and Vachez, Laurent}, biburl = {https://www.bibsonomy.org/bibtex/2a3c8a1bba5f87d513a74aac3be249cbf/dblp}, ee = {https://doi.org/10.1007/s10836-012-5277-4}, interhash = {93de9c76a31c103333ed14f7295dbf0e}, intrahash = {a3c8a1bba5f87d513a74aac3be249cbf}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 2, pages = {215-228}, timestamp = {2020-09-12T11:41:17.000+0200}, title = {Analysis and Fault Modeling of Actual Resistive Defects in ATMEL TSTACTM eFlash Memories.}, url = {http://dblp.uni-trier.de/db/journals/et/et28.html#MaurouxVBDGPGFV12}, volume = 28, year = 2012 }