%0 Conference Paper %1 conf/vlsid/GuoPR01 %A Guo, Ruifeng %A Pomeranz, Irith %A Reddy, Sudhakar M. %B VLSI Design %D 2001 %I IEEE Computer Society %K dblp %P 111-116 %T On Improving Static Test Compaction for Sequential Circuits. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2001.html#GuoPR01 %@ 0-7695-0831-6

@inproceedings{conf/vlsid/GuoPR01, added-at = {2023-03-24T00:00:00.000+0100}, author = {Guo, Ruifeng and Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/218ce88a931efb56e545dee40d32df59e/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.2001.902648}, interhash = {968ff3b9d2029c8d4a5efb8c8b7566f4}, intrahash = {18ce88a931efb56e545dee40d32df59e}, isbn = {0-7695-0831-6}, keywords = {dblp}, pages = {111-116}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:19:08.000+0200}, title = {On Improving Static Test Compaction for Sequential Circuits.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2001.html#GuoPR01}, year = 2001 }