%0 Journal Article %1 journals/tvlsi/GuanM16 %A Guan, Zhong %A Marek-Sadowska, Malgorzata %D 2016 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 6 %P 2195-2207 %T Incorporating Process Variations Into SRAM Electromigration Reliability Assessment Using Atomic Flux Divergence. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi24.html#GuanM16 %V 24

@article{journals/tvlsi/GuanM16, added-at = {2020-03-11T00:00:00.000+0100}, author = {Guan, Zhong and Marek-Sadowska, Malgorzata}, biburl = {https://www.bibsonomy.org/bibtex/218d2a9156c80be1fe0f09f9a665b2383/dblp}, ee = {https://doi.org/10.1109/TVLSI.2015.2501900}, interhash = {9d254d0c74ae6a09fd1abf6cfed46f24}, intrahash = {18d2a9156c80be1fe0f09f9a665b2383}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 6, pages = {2195-2207}, timestamp = {2020-03-12T11:45:29.000+0100}, title = {Incorporating Process Variations Into SRAM Electromigration Reliability Assessment Using Atomic Flux Divergence.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi24.html#GuanM16}, volume = 24, year = 2016 }