%0 Conference Paper %1 conf/ats/IwataOIF10 %A Iwata, Hiroshi %A Ohtake, Satoshi %A Inoue, Michiko %A Fujiwara, Hideo %B Asian Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 206-211 %T Bipartite Full Scan Design: A DFT Method for Asynchronous Circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats2010.html#IwataOIF10 %@ 978-0-7695-4248-5

@inproceedings{conf/ats/IwataOIF10, added-at = {2023-03-24T00:00:00.000+0100}, author = {Iwata, Hiroshi and Ohtake, Satoshi and Inoue, Michiko and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2f2a68066158b55a2a37ff94a078e69b5/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2010}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2010.44}, interhash = {9dd1ac878d143c0ee58a351f50cad791}, intrahash = {f2a68066158b55a2a37ff94a078e69b5}, isbn = {978-0-7695-4248-5}, keywords = {dblp}, pages = {206-211}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:56.000+0200}, title = {Bipartite Full Scan Design: A DFT Method for Asynchronous Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2010.html#IwataOIF10}, year = 2010 }