Meta data
- BibTeX key
- conf/socpar/ChiangLC15
- entry type
- inproceedings
- booktitle
- SoCPaR
- year
- 2015
- pages
- 274-277
- publisher
- IEEE
- crossref
- conf/socpar/2015
- ee
- https://doi.org/10.1109/SOCPAR.2015.7492820
- isbn
- 978-1-4673-9360-7
- url
- http://dblp.uni-trier.de/db/conf/socpar/socpar2015.html#ChiangLC15
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- please select -%0 Conference Paper
%1 conf/socpar/ChiangLC15
%A Chiang, Yu-Min
%A Lin, Yih-Lon
%A Chien, Wei-Hong
%B SoCPaR
%D 2015
%E Köppen, Mario
%E Xue, Bing
%E Takagi, Hideyuki
%E Abraham, Ajith
%E Muda, Azah Kamilah
%E Ma, Kun
%I IEEE
%K dblp
%P 274-277
%T Automated surface defect inspection system for capacitive touch sensor.
%U http://dblp.uni-trier.de/db/conf/socpar/socpar2015.html#ChiangLC15
%@ 978-1-4673-9360-7
@inproceedings{conf/socpar/ChiangLC15,
added-at = {2017-05-19T00:00:00.000+0200},
author = {Chiang, Yu-Min and Lin, Yih-Lon and Chien, Wei-Hong},
biburl = {https://www.bibsonomy.org/bibtex/2b611bc9a990df505de786945431ab9d6/dblp},
booktitle = {SoCPaR},
crossref = {conf/socpar/2015},
editor = {Köppen, Mario and Xue, Bing and Takagi, Hideyuki and Abraham, Ajith and Muda, Azah Kamilah and Ma, Kun},
ee = {https://doi.org/10.1109/SOCPAR.2015.7492820},
interhash = {a01e4121743cbf2eff45170305ca2da2},
intrahash = {b611bc9a990df505de786945431ab9d6},
isbn = {978-1-4673-9360-7},
keywords = {dblp},
pages = {274-277},
publisher = {IEEE},
timestamp = {2024-04-09T11:47:42.000+0200},
title = {Automated surface defect inspection system for capacitive touch sensor.},
url = {http://dblp.uni-trier.de/db/conf/socpar/socpar2015.html#ChiangLC15},
year = 2015
}