%0 Conference Paper %1 conf/vts/JeeF93 %A Jee, Alvin %A Ferguson, F. Joel %B VTS %D 1993 %I IEEE Computer Society %K dblp %P 92-98 %T Carafe: an inductive fault analysis tool for CMOS VLSI circuits. %U http://dblp.uni-trier.de/db/conf/vts/vts1993.html#JeeF93 %@ 0-8186-3830-3

@inproceedings{conf/vts/JeeF93, added-at = {2023-03-24T00:00:00.000+0100}, author = {Jee, Alvin and Ferguson, F. Joel}, biburl = {https://www.bibsonomy.org/bibtex/206adb133817e413e996598ddec5dbcaa/dblp}, booktitle = {VTS}, crossref = {conf/vts/1993}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1993.313302}, interhash = {a1506727fbbe6353a70d710fdaf93a98}, intrahash = {06adb133817e413e996598ddec5dbcaa}, isbn = {0-8186-3830-3}, keywords = {dblp}, pages = {92-98}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:06.000+0200}, title = {Carafe: an inductive fault analysis tool for CMOS VLSI circuits.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1993.html#JeeF93}, year = 1993 }