%0 Conference Paper %1 conf/icst/PerrouinSKBT10 %A Perrouin, Gilles %A Sen, Sagar %A Klein, Jacques %A Baudry, Benoit %A Traon, Yves Le %B ICST %D 2010 %I IEEE Computer Society %K %P 459-468 %T Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines. %U http://dblp.uni-trier.de/db/conf/icst/icst2010.html#PerrouinSKBT10 %@ 978-0-7695-3990-4

@inproceedings{conf/icst/PerrouinSKBT10, added-at = {2023-12-13T05:25:57.000+0100}, author = {Perrouin, Gilles and Sen, Sagar and Klein, Jacques and Baudry, Benoit and Traon, Yves Le}, biburl = {https://www.bibsonomy.org/bibtex/2832d135165e337cc5fd9d479c35d1255/admin}, booktitle = {ICST}, crossref = {conf/icst/2010}, ee = {http://doi.ieeecomputersociety.org/10.1109/ICST.2010.43}, interhash = {a2793a7b6cef5e1c9ab23c31ce19e6d4}, intrahash = {832d135165e337cc5fd9d479c35d1255}, isbn = {978-0-7695-3990-4}, keywords = {}, pages = {459-468}, publisher = {IEEE Computer Society}, timestamp = {2023-12-13T05:25:57.000+0100}, title = {Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines.}, url = {http://dblp.uni-trier.de/db/conf/icst/icst2010.html#PerrouinSKBT10}, year = 2010 }