%0 Journal Article %1 journals/et/SasakiNI08 %A Sasaki, Yoichi %A Namba, Kazuteru %A Ito, Hideo %D 2008 %J J. Electron. Test. %K dblp %N 1-3 %P 11-19 %T Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger. %U http://dblp.uni-trier.de/db/journals/et/et24.html#SasakiNI08 %V 24

@article{journals/et/SasakiNI08, added-at = {2020-09-11T00:00:00.000+0200}, author = {Sasaki, Yoichi and Namba, Kazuteru and Ito, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/28df97a545ac3dd8258175965b63198a8/dblp}, ee = {https://doi.org/10.1007/s10836-007-5034-2}, interhash = {1b6c8a8d277b6ef4d157e294232a5224}, intrahash = {8df97a545ac3dd8258175965b63198a8}, journal = {J. Electron. Test.}, keywords = {dblp}, number = {1-3}, pages = {11-19}, timestamp = {2020-09-12T11:41:02.000+0200}, title = {Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger.}, url = {http://dblp.uni-trier.de/db/journals/et/et24.html#SasakiNI08}, volume = 24, year = 2008 }