%0 Journal Article %1 journals/mr/PaganoLPKKYCBS08 %A Pagano, R. %A Lombardo, Salvatore %A Palumbo, Felix %A Kirsch, Paul %A Krishnan, S. A. %A Young, Chadwin D. %A Choi, Rino %A Bersuker, Gennadi %A Stathis, James H. %D 2008 %J Microelectron. Reliab. %K dblp %N 11-12 %P 1759-1764 %T A novel approach to characterization of progressive breakdown in high-k/metal gate stacks. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#PaganoLPKKYCBS08 %V 48

@article{journals/mr/PaganoLPKKYCBS08, added-at = {2021-10-14T00:00:00.000+0200}, author = {Pagano, R. and Lombardo, Salvatore and Palumbo, Felix and Kirsch, Paul and Krishnan, S. A. and Young, Chadwin D. and Choi, Rino and Bersuker, Gennadi and Stathis, James H.}, biburl = {https://www.bibsonomy.org/bibtex/252a5f04b1cf0988324f077350ef36e88/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.07.071}, interhash = {b70c98dde262811442e67dc24dd3998a}, intrahash = {52a5f04b1cf0988324f077350ef36e88}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {11-12}, pages = {1759-1764}, timestamp = {2024-04-09T02:50:51.000+0200}, title = {A novel approach to characterization of progressive breakdown in high-k/metal gate stacks.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#PaganoLPKKYCBS08}, volume = 48, year = 2008 }