%0 Journal Article %1 journals/mr/KalavaguntaMRS14 %A Kalavagunta, Aditya %A Mukherjee, Shubhajit %A Reed, Robert A. %A Schrimpf, Ronald D. %D 2014 %J Microelectron. Reliab. %K dblp %N 3 %P 570-574 %T Comparison between trap and self-heating induced mobility degradation in AlGaN/GaN HEMTs. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#KalavaguntaMRS14 %V 54

@article{journals/mr/KalavaguntaMRS14, added-at = {2020-02-22T00:00:00.000+0100}, author = {Kalavagunta, Aditya and Mukherjee, Shubhajit and Reed, Robert A. and Schrimpf, Ronald D.}, biburl = {https://www.bibsonomy.org/bibtex/2be85189261af9a760da41b0a059f9a98/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.10.018}, interhash = {b998a1840bf616d1f9d93238dd683255}, intrahash = {be85189261af9a760da41b0a059f9a98}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 3, pages = {570-574}, timestamp = {2020-02-25T13:25:51.000+0100}, title = {Comparison between trap and self-heating induced mobility degradation in AlGaN/GaN HEMTs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#KalavaguntaMRS14}, volume = 54, year = 2014 }