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%0 Journal Article
%1 journals/dt/LinPRRRST03
%A Lin, Xijiang
%A Press, Ron
%A Rajski, Janusz
%A Reuter, Paul
%A Rinderknecht, Thomas
%A Swanson, Bruce
%A Tamarapalli, Nagesh
%D 2003
%J IEEE Des. Test Comput.
%K dblp
%N 5
%P 17-25
%T High-Frequency, At-Speed Scan Testing.
%U http://dblp.uni-trier.de/db/journals/dt/dt20.html#LinPRRRST03
%V 20
@article{journals/dt/LinPRRRST03,
added-at = {2020-05-17T00:00:00.000+0200},
author = {Lin, Xijiang and Press, Ron and Rajski, Janusz and Reuter, Paul and Rinderknecht, Thomas and Swanson, Bruce and Tamarapalli, Nagesh},
biburl = {https://www.bibsonomy.org/bibtex/24c240fae1e0bc053857b86484d3ca8cd/dblp},
ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1232252},
interhash = {1bb837e7458435cc0e5454fae40476fc},
intrahash = {4c240fae1e0bc053857b86484d3ca8cd},
journal = {IEEE Des. Test Comput.},
keywords = {dblp},
number = 5,
pages = {17-25},
timestamp = {2020-05-19T12:21:25.000+0200},
title = {High-Frequency, At-Speed Scan Testing.},
url = {http://dblp.uni-trier.de/db/journals/dt/dt20.html#LinPRRRST03},
volume = 20,
year = 2003
}