%0 Journal Article %1 journals/mr/ArehartSVPHR16 %A Arehart, A. R. %A Sasikumar, A. %A Via, G. D. %A Poling, B. S. %A Heller, E. R. %A Ringel, S. A. %D 2016 %J Microelectron. Reliab. %K dblp %P 45-48 %T Evidence for causality between GaN RF HEMT degradation and the EC-0.57 eV trap in GaN. %U http://dblp.uni-trier.de/db/journals/mr/mr56.html#ArehartSVPHR16 %V 56

@article{journals/mr/ArehartSVPHR16, added-at = {2020-02-22T00:00:00.000+0100}, author = {Arehart, A. R. and Sasikumar, A. and Via, G. D. and Poling, B. S. and Heller, E. R. and Ringel, S. A.}, biburl = {https://www.bibsonomy.org/bibtex/2ffbf86f994f75287602e3330624609e6/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.11.007}, interhash = {bbcdfd7f0374adde0150bec1041e0a01}, intrahash = {ffbf86f994f75287602e3330624609e6}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {45-48}, timestamp = {2020-02-25T13:29:02.000+0100}, title = {Evidence for causality between GaN RF HEMT degradation and the EC-0.57 eV trap in GaN.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr56.html#ArehartSVPHR16}, volume = 56, year = 2016 }