%0 Journal Article %1 journals/jsac/ChangMA84 %A Chang, Hyokang %A Morton, Steven Gregory %A Agrawal, Bhagwati Prasad %D 1984 %J IEEE J. Sel. Areas Commun. %K dblp %N 2 %P 374-380 %T Line, Trunk, and Service Circuit Test System of ITT System 1240. %U http://dblp.uni-trier.de/db/journals/jsac/jsac2.html#ChangMA84 %V 2

@article{journals/jsac/ChangMA84, added-at = {2020-04-02T00:00:00.000+0200}, author = {Chang, Hyokang and Morton, Steven Gregory and Agrawal, Bhagwati Prasad}, biburl = {https://www.bibsonomy.org/bibtex/2ecaad3a5e614a1ef39e0907770df9b9e/dblp}, ee = {https://doi.org/10.1109/JSAC.1984.1146065}, interhash = {c976e35756fa0844a979fd7ef3eddf0b}, intrahash = {ecaad3a5e614a1ef39e0907770df9b9e}, journal = {IEEE J. Sel. Areas Commun.}, keywords = {dblp}, number = 2, pages = {374-380}, timestamp = {2020-04-03T11:52:37.000+0200}, title = {Line, Trunk, and Service Circuit Test System of ITT System 1240.}, url = {http://dblp.uni-trier.de/db/journals/jsac/jsac2.html#ChangMA84}, volume = 2, year = 1984 }