%0 Conference Paper %1 conf/icst/HenardPPKT13 %A Henard, Christopher %A Papadakis, Mike %A Perrouin, Gilles %A Klein, Jacques %A Traon, Yves Le %B ICST Workshops %D 2013 %I IEEE Computer Society %K %P 188-197 %T Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing. %U http://dblp.uni-trier.de/db/conf/icst/icstw2013.html#HenardPPKT13 %@ 978-1-4799-1324-4

@inproceedings{conf/icst/HenardPPKT13, added-at = {2023-12-13T09:22:14.000+0100}, author = {Henard, Christopher and Papadakis, Mike and Perrouin, Gilles and Klein, Jacques and Traon, Yves Le}, biburl = {https://www.bibsonomy.org/bibtex/2f3b15e50b9dff0a08fe493e8cf9db77f/admin}, booktitle = {ICST Workshops}, crossref = {conf/icst/2013w}, ee = {http://doi.ieeecomputersociety.org/10.1109/ICSTW.2013.30}, interhash = {cd85181a38d156f3020a0f9787ce8bc1}, intrahash = {f3b15e50b9dff0a08fe493e8cf9db77f}, isbn = {978-1-4799-1324-4}, keywords = {}, pages = {188-197}, publisher = {IEEE Computer Society}, timestamp = {2023-12-13T09:22:14.000+0100}, title = {Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing.}, url = {http://dblp.uni-trier.de/db/conf/icst/icstw2013.html#HenardPPKT13}, year = 2013 }