%0 Conference Paper %1 conf/ats/BasithKR10 %A Basith, Iftekhar Ibne %A Kandalaft, Nabeeh %A Rashidzadeh, Rashid %B Asian Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 135-140 %T Built-In Self-Test for Capacitive MEMS Using a Charge Control Technique. %U http://dblp.uni-trier.de/db/conf/ats/ats2010.html#BasithKR10 %@ 978-0-7695-4248-5

@inproceedings{conf/ats/BasithKR10, added-at = {2023-03-24T00:00:00.000+0100}, author = {Basith, Iftekhar Ibne and Kandalaft, Nabeeh and Rashidzadeh, Rashid}, biburl = {https://www.bibsonomy.org/bibtex/2ef12c54926a6f6368d2cdcf756f883a9/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2010}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2010.32}, interhash = {ce5ff40c2819a5c797c9996d2b03833a}, intrahash = {ef12c54926a6f6368d2cdcf756f883a9}, isbn = {978-0-7695-4248-5}, keywords = {dblp}, pages = {135-140}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:56.000+0200}, title = {Built-In Self-Test for Capacitive MEMS Using a Charge Control Technique.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2010.html#BasithKR10}, year = 2010 }